| /linux-6.15/tools/testing/selftests/arm64/signal/ |
| H A D | Makefile | 7 SRCS := $(filter-out testcases/testcases.c,$(wildcard testcases/*.c))
25 COMMON_SOURCES := test_signals.c test_signals_utils.c testcases/testcases.c \
27 COMMON_HEADERS := test_signals.h test_signals_utils.h testcases/testcases.h
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| H A D | README | 20 - New tests can be simply defined in testcases/ dir providing a proper struct
39 unrelated SEGV bugs in the testcases, it becomes extremely tricky to
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| /linux-6.15/tools/testing/selftests/x86/ |
| H A D | lam.c | 80 struct testcases { struct
86 int (*test_func)(struct testcases *test); argument
288 int handle_max_bits(struct testcases *test) in handle_max_bits()
736 int handle_uring(struct testcases *test) in handle_uring()
847 struct testcases *test = arg; in thread_fn_set_lam()
914 struct testcases *t = test + i; in run_test()
935 static struct testcases uring_cases[] = {
967 static struct testcases bits_cases[] = {
1017 static struct testcases mmap_cases[] = {
1207 int handle_pasid(struct testcases *test) in handle_pasid()
[all …]
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| /linux-6.15/tools/testing/selftests/ftrace/ |
| H A D | README | 3 This is a collection of testcases for ftrace tracing feature in the Linux
7 Running the ftrace testcases
11 To run all testcases:
15 To run specific testcases:
19 Or you can also run testcases under given directory:
23 Contributing new testcases
36 * You can add a directory for your testcases under test.d/ if needed.
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| /linux-6.15/Documentation/translations/zh_CN/devicetree/ |
| H A D | of_unittest.rst | 35 设备树源文件（drivers/of/unittest-data/testcases.dts）包含执行drivers/of/unittest.c
36 中自动化单元测试所需的测试数据。目前，以下设备树源包含文件（.dtsi）被包含在testcases.dt中::
48 用于将DT源文件（testcases.dts）编译成二进制blob（testcases.dtb），也被称为扁平化的DT。
50 之后，使用以下规则将上述二进制blob包装成一个汇编文件（testcases.dtb.S）::
55 汇编文件被编译成一个对象文件（testcases.dtb.o），并被链接到内核镜像中。
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| /linux-6.15/tools/testing/selftests/kvm/ |
| H A D | guest_memfd_test.c | 98 } testcases[] = { in test_invalid_punch_hole() local
114 for (i = 0; i < ARRAY_SIZE(testcases); i++) { in test_invalid_punch_hole()
116 testcases[i].offset, testcases[i].len); in test_invalid_punch_hole()
119 testcases[i].offset, testcases[i].len); in test_invalid_punch_hole()
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| /linux-6.15/tools/testing/selftests/tc-testing/ |
| H A D | tdc_helper.py | 10 testcases = dict()
13 testcases[category] = list(filter(lambda x: category in x['category'], alltests))
15 return(testcases)
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| H A D | tdc.py | 921 ucat, idlist, testcases, alltests = get_test_cases(args)
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| /linux-6.15/tools/testing/selftests/mm/ |
| H A D | uffd-wp-mremap.c | 259 static const struct testcase testcases[] = { variable
358 for (i = 0; i < ARRAY_SIZE(testcases); i++) in main()
359 plan += *testcases[i].nr_sizes; in main()
366 for (i = 0; i < ARRAY_SIZE(testcases); i++) { in main()
367 const struct testcase *tc = &testcases[i]; in main()
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| H A D | va_high_addr_switch.c | 35 static struct testcase *testcases; variable
248 testcases = malloc(sizeof(t)); in testcases_init()
252 memcpy(testcases, t, sizeof(t)); in testcases_init()
332 ret = run_test(testcases, sz_testcases); in main()
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| /linux-6.15/Documentation/devicetree/ |
| H A D | of_unittest.rst | 51 The Device Tree Source file (drivers/of/unittest-data/testcases.dts) contains
57 for the Device Tree Source Include files (.dtsi) included in testcases.dts.
65 is used to compile the DT source file (testcases.dts) into a binary blob
66 (testcases.dtb), also referred as flattened DT.
69 assembly file (testcases.dtb.S)::
74 The assembly file is compiled into an object file (testcases.dtb.o), and is
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| /linux-6.15/tools/testing/selftests/powerpc/stringloops/ |
| H A D | memcmp.c | 153 static int testcases(void) in testcases() function
168 return test_harness(testcases, "memcmp"); in main()
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| /linux-6.15/tools/perf/tests/ |
| H A D | hists_cumulate.c | 713 test_fn_t testcases[] = { in test__hists_cumulate() local
739 for (i = 0; i < ARRAY_SIZE(testcases); i++) { in test__hists_cumulate()
740 err = testcases[i](evsel, machine); in test__hists_cumulate()
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| H A D | hists_output.c | 599 test_fn_t testcases[] = { in test__hists_output() local
626 for (i = 0; i < ARRAY_SIZE(testcases); i++) { in test__hists_output()
627 err = testcases[i](evsel, machine); in test__hists_output()
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| /linux-6.15/drivers/of/unittest-data/ |
| H A D | Makefile | 2 obj-y += testcases.dtbo.o
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| H A D | tests-interrupts.dtsi | 100 * located in testcases.dts instead of in this file so that the
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| /linux-6.15/Documentation/process/ |
| H A D | botching-up-ioctls.rst | 81 * Have simple testcases for all of the above.
99 * Have simple testcases for every input validation failure case in your ioctl.
122 * Have testcases for the really tricky corner cases in your error recovery code
163 * Have testcases for corner-cases, especially whether the return values for
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| H A D | maintainer-kvm-x86.rst | 277 but dedicated KVM tests are preferred in all cases. Negative testcases in
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| /linux-6.15/Documentation/gpu/ |
| H A D | vkms.rst | 132 all relevant igt testcases work on vkms. They are good options for internship
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| H A D | drm-uapi.rst | 97 userspace project. For e.g. mesa this means piglit testcases and review on the
571 should have driver-agnostic testcases in IGT for that feature, if such a test
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| H A D | todo.rst | 330 Might be good to also have some igt testcases for this.
681 including tons of testcases for corner-cases in the modesetting API. It would
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| /linux-6.15/Documentation/fault-injection/ |
| H A D | fault-injection.rst | 106 for some testcases. Consider setting probability=100 and configure
107 /sys/kernel/debug/fail*/interval for such testcases.
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| /linux-6.15/Documentation/bpf/ |
| H A D | cpumasks.rst | 384 selftest testcases to the cpumask selftest suite.
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| /linux-6.15/Documentation/locking/ |
| H A D | robust-futexes.rst | 215 robust-mutex testcases.
|